Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System
Author
Eisenmann, James William, III
Abstract
A material analysis system using particle-induced x-ray emission (PIXE) analysis has been developed to measure trace element composition in a wide range of samples. The system was constructed in the particle accelerator laboratory in the Department of Physics at East Carolina University, and includes a new high-vacuum beamline on the 2-million-volt tandem Pelletron ion accelerator, which includes a modified multi-sample target chamber. PIXE analysis can provide sensitivities to the parts-per-million level or better for many elements. In this method, a sample is irradiated with protons in the energy range of 1 - 3 MeV from the particle accelerator. Characteristic x-rays emitted from the sample are detected with an x-ray spectrometer, and the emission spectrum is fit using known spectral line energies to determine elemental composition of the sample. Capabilities of the new PIXE analysis system, including a new state-of-the-art x-ray spectrometer and multi-sample target system, will be presented, and proposed multidisciplinary applications, such as in geology, will be discussed.
Date
2019-05-07
Citation:
APA:
Eisenmann, James William, III.
(May 2019).
Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System
(Master's Thesis, East Carolina University). Retrieved from the Scholarship.
(http://hdl.handle.net/10342/7464.)
MLA:
Eisenmann, James William, III.
Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System.
Master's Thesis. East Carolina University,
May 2019. The Scholarship.
http://hdl.handle.net/10342/7464.
March 28, 2024.
Chicago:
Eisenmann, James William, III,
“Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System”
(Master's Thesis., East Carolina University,
May 2019).
AMA:
Eisenmann, James William, III.
Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System
[Master's Thesis]. Greenville, NC: East Carolina University;
May 2019.
Collections
Publisher
East Carolina University