Author | Hu, Xin-hua | |
Author | Chen, Cheng | |
Date Accessioned | 2019-11-11T18:38:20Z | |
Date Available | 2019-11-11T18:38:20Z | |
Date of Issue | 2010-04-08 | |
Identifier (Other) | International Publication # WO2010039921A3 | |
Identifier (URI) | http://hdl.handle.net/10342/7538 | |
Description | Special character modification may be required in the abstract. | en_US |
Description | Methods and systems for optically characterizing a turbid sample are provided. A structured light beam is impinged on the sample. The sample includes an embedded region. A reflected light image of the structured light beam is detected from the sample. A measured reflectance image of the structured light beam for the sample is determined based on the reflected light image and a reflectance standard. The following parameters are determined: absorption coefficients ÿa, scattering coefficient ÿs and anisotropy factor g of the sample from the reflectance image. A size parameter of the embedded region is estimated based on the absorption coefficients ÿa, scattering coefficient ÿs and/or anisotropy factor g of the sample from the measured reflectance image. | en_US |
Language | en_US | en_US |
Related URI | https://patents.google.com/patent/WO2010039921A3/en?oq=inassignee:%22East+Carolina%22 | en_US |
Title | Methods and systems for optically characterizing a turbid material using a structured incident beam | en_US |
Type | Patent | en_US |