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Laser tweezers and Raman spectroscopy systems and methods for the study of microscopic particles

dc.contributor.authorLi, Yong-Qing
dc.contributor.authorDinno, Mumtaz
dc.date.accessioned2016-02-05T15:39:29Z
dc.date.available2016-02-05T15:39:29Z
dc.date.issued2005-05-24
dc.description.abstractMethods and systems for studying microscopic particles are provided. An optical trap for a selected microscopic particle can be formed with a laser beam at a first power level. The laser beam can have a variable power level associated therewith. The variable power level can be increased to a second power level. The laser beam at the second power level can produce Raman scattering signals. The second power level can provide sufficient excitation energy to the selected microscopic particle to produce Raman scattering signals and the second power level is higher than the first power level. A Raman spectrum can be detected from the Raman scattering signals produced by the laser beam at the second power level.en_US
dc.identifier.otherU.S. Patent No. 6,897,950
dc.identifier.urihttp://hdl.handle.net/10342/5163
dc.titleLaser tweezers and Raman spectroscopy systems and methods for the study of microscopic particlesen_US
dc.typePatenten_US

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