Complementary Square Wave Voltammetry and Tandem Mass Spectrometry Analysis to Identify and Detect Compensatory Genomic Changes in Nematodes Due to Nickel (II) Exposure
dc.contributor.author | LaFave, Elizabeth R. | |
dc.contributor.author | Turner, Ryne | |
dc.contributor.author | Schaaf, Nicholas J. | |
dc.contributor.author | Hindi, Thekra | |
dc.contributor.author | Rudel, David | |
dc.contributor.author | Hvastkovs, Eli G. | |
dc.date.accessioned | 2023-03-13T19:40:43Z | |
dc.date.available | 2023-03-13T19:40:43Z | |
dc.date.issued | 2022 | |
dc.identifier.doi | 10.1016/j.snr.2021.100070 | |
dc.identifier.issn | 2666-0539 | |
dc.identifier.uri | http://hdl.handle.net/10342/12411 | |
dc.language.iso | en_US | en_US |
dc.subject | SWV analysis | en_US |
dc.subject | DNA damage | en_US |
dc.subject | Nematode DNA | en_US |
dc.title | Complementary Square Wave Voltammetry and Tandem Mass Spectrometry Analysis to Identify and Detect Compensatory Genomic Changes in Nematodes Due to Nickel (II) Exposure | en_US |
dc.type | Article | en_US |
ecu.journal.name | Sensors and Actuators Reports | en_US |
ecu.journal.volume | 4 | en_US |
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