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    Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System

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    EISENMANN-MASTERSTHESIS-2019.pdf (5.648Mb)
    Eisenmann THESIS.pdf (5.639Mb)

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    Author
    Eisenmann, James William, III
    Abstract
    A material analysis system using particle-induced x-ray emission (PIXE) analysis has been developed to measure trace element composition in a wide range of samples. The system was constructed in the particle accelerator laboratory in the Department of Physics at East Carolina University, and includes a new high-vacuum beamline on the 2-million-volt tandem Pelletron ion accelerator, which includes a modified multi-sample target chamber. PIXE analysis can provide sensitivities to the parts-per-million level or better for many elements. In this method, a sample is irradiated with protons in the energy range of 1 - 3 MeV from the particle accelerator. Characteristic x-rays emitted from the sample are detected with an x-ray spectrometer, and the emission spectrum is fit using known spectral line energies to determine elemental composition of the sample. Capabilities of the new PIXE analysis system, including a new state-of-the-art x-ray spectrometer and multi-sample target system, will be presented, and proposed multidisciplinary applications, such as in geology, will be discussed.
    URI
    http://hdl.handle.net/10342/7464
    Date
    2019-05-07
    Citation:
    APA:
    Eisenmann, James William, III. (May 2019). Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System (Master's Thesis, East Carolina University). Retrieved from the Scholarship. (http://hdl.handle.net/10342/7464.)

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    MLA:
    Eisenmann, James William, III. Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System. Master's Thesis. East Carolina University, May 2019. The Scholarship. http://hdl.handle.net/10342/7464. April 19, 2021.
    Chicago:
    Eisenmann, James William, III, “Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System” (Master's Thesis., East Carolina University, May 2019).
    AMA:
    Eisenmann, James William, III. Development of a Proton Induced X-Ray Emission (PIXE) Material Analysis System [Master's Thesis]. Greenville, NC: East Carolina University; May 2019.
    Collections
    • Master's Theses
    Publisher
    East Carolina University

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