Employment of GUPIXWIN Analysis System in Particle-Induced X-Ray (PIXE) Material Analysis

Abstract

Particle-Induced X-Ray Emission (PIXE) is a multi-elemental material analysis method used for nondestructive analysis of samples. Improvements to the beam line and PIXE chamber in East Carolina University's particle accelerator laboratory have been made to improve the quantitative and qualitative analysis of samples. Installation of a new Amptek FAST SDD[Registered] detector with a new mount facilitated initial testing and calibration with radioisotopes of Fe-55 and Cs-137. Further implementation of the GUPIXWIN software has been done for better quantitative analysis of samples by a custom detector profile for the new detector. Tests have been performed using several foil samples of varying thicknesses and composition as well as calibration standards to allow for an energy dependent H value for more accurate analysis of samples. A dependence on beam current was found for the H value and thus individual energy dependent H value profiles have been obtained for beam currents of 5nA, 10nA, and 25nA. These profiles were tested against the standards and foils from before for element ratios and trace elemental analysis respectively.